搜索资源列表
2407RAM_Test
- 基于TMS320LF407的RAM测试程序源码-The RAM-based test program source code TMS320LF407
EMIF_RAM_test
- dsp和ram之间的emif接口的测试工程及程序，检测它们之间的数据通信是否正确-dsp and ram emif interface between the test project and procedures to detect the data communication between them is correct
testram
- 这是一个测试5402dsp内部ram和外扩ram的程序，经过测试可用-This is a test 5402 internal and external expansion ram ram procedures, tested available
BulkLoopTest
- 程序执行时，往EP2OUT/EP4OUT填充数据后将立即通过自动指针传送送到EP6IN/EP8IN端点（未经过外部RAM），来进行批量端点环路测试。-Program execution, to EP2OUT/EP4OUT immediately after filling the data sent through the automatic pointer sent EP6IN/EP8IN endpoint (not through the external RAM), to carry ou
c8051f020_read_e2prom_xram
- 本程序代码访问eeprom 和 外部扩展ram ，程序经过了长期考验，绝对可靠。-The code to access eeprom and external expansion ram, after a long period of test procedures, absolutely reliable.
flashdemo
- quick test for Cypress RAm (here: 64 MB): VHDL example to test speed and quality of data: write and read process used.
EXRAM
- 此程序是测试DSP5402最小系统板上的RAM,及数据线、地址线能否正常工作。若正常工作LA0灯按一定频率闪烁。-This procedure is to test the DSP board RAM, and data lines, address lines can work. If the work LA0 lights flashing at a certain frequency.
ramchip
- vhdl code for ram design test bench
FM24cl04
- 使用硬件I2C对铁电存储器进行操作，利用中断方式操作。 向FM24CL04中0x03地址写入100字节数据，并检验，如果检验成功则蜂鸣器响一下，否则不断报警 铁电FM24CL04，封装和普通的E2PROM一致，读写方式和E2PROM均采用I2C总线，和E2PROM不同的是 铁电存储器可以当成是RAM来使用，可以说是串行的RAM，可以随机的读写-Use hardware I2C operation of ferroelectric memory, the use of i
6soft_247MHz_channel
- lte上行信道解交织解复用: RTL: ack_addr_gen.vhd ack地址产生 data_addr_gen.vhd 数据地址产生 de_interl_mux_con_ctrl.vhd 控制单元 de_interl_mux_con_top.vhd 顶层 de_interl_mux_con_tt.vhd 测试平台 de_mux_ram.vhd ram deinterl_pack.vhd 变量定义 delay.vhd 延迟 delayb.vhd 延迟
zifuchuan
- 把长度为10H的字符串从内部RAM的输入缓冲区inbuf向位物外部RAM的输出缓冲区outbuf传送，一直进行到遇见回车或整个字符串传送完毕。试编程实现-The length of the string from the internal RAM 10H input buffer inbuf bit outside of the RAM to the output buffer outbuf transfer, has been carried out to meet the return or
tstSRAM
- 测试STC系列片外ram大小，如果ram溢出，即地址访问出错，串口输出数据是未定义的。-STC Test series outside the ram size, if the ram overflow error that address access, serial output data is undefined.
I2C
- 单片微机的P1.0(SCL)和P1.1(SDA)两根I/O口线构成虚拟I2C总线，扩展串行EEPROM芯片24C02。对扩展的串行数据存储器24C02进行自检，若每一单元读/写都正确，则把片内RAM中20H单元内容清0，否则置20H内容为FFH。-80C51 single-chip microcomputer using P1.0 (SCL) and P1.1 (SDA) two I/O port lines constitute a virtual I2C bus, extended seri
usbPflashPtouchPtftPram_COCO
- usb+flash+touch+tft+ram综合测试_-usb+ flash+ touch+ tft+ ram Integrated Test _COCO
ntier_test
- 本测试程序采用框架中多层核心组件编写，演示了操作数据的各种那个功能，以及程序性能。服务器使用的是2M的ADSL动态IP网络的普通电脑，配置为I5处理器，4G内存，WIN7旗舰版。由于2M的ADSL做服务器上传速度只有最大50K/s所以会大幅影响速度。 在这个服务器环境下，单一客户端检索1000条数据大概要2秒，做多客户端并发下，会大幅度提高速度。如果服务器换专用托管的服务器，10M共享带宽下，单一客户端检索1000条数据大概在400毫秒左右。 -The test program uses
General-memory-VHDL-code-library
- 通用存储器VHDL代码库。fifo,ram寄存器的代码和测试模块。-General-purpose memory VHDL code base. fifo, ram register code and test modules.
fft
- This a vhdl code written to compute fft for the values stored in a RAM. The fft values are stored in bit reversed order finally in the same RAM. Not sure if it is working 100 . For my test input it worked.-This is a vhdl code written to compute fft f
FLASH
- DSP2407应用外部FLASH来进行调试或者使用外部RAM调试的例程分析比较。-DSP2407 USE FLASH TO TEST,VERY USEFUL FOR THE NEWER!PLEASE STUDY CAREFULY.AAA CCC BBB SSS SS DDD DDD V V .EWQEWQ DSDS DWDSD WDEWQEW WEWE WEEW ERWRWE EERWE EWEFE RYJ RGTRHT RGRGB TGTYU
AdualportramtT
- 采用两片AT89S51对双口RAM IDT7132测试试程序，采用串口助手显示接收内容。， -Using the two AT89S51 dual-port RAM the IDT7132 test pilot program, the serial assistant receive content. ,
dualram
- 本文件给出了一种双口RAM的代码，开发语言为verilog。测试可用，欢迎下载-This document gives a dual-port RAM code verilog development language. Test is available, welcome to download