搜索资源列表
NRS4000_cpu
- 现代先进微处理器有非常高的集成度和复杂度,又有寄存器堆、Cache等嵌入式部件,而且芯片管脚数相对较少,必须要有一定的自测试设计和其它的可测试性设计来简化测试代码,提高故障覆盖率。本文简要讨论NRS4000微处理器芯片的以边界扫描测试为主体,以自测试为补充的可测试性设计框架。着重介绍芯片的边界扫描设计和芯片中译码控制器PLA和微程序ROM以及采用内嵌RAM结构的指令Cache和寄存器堆的内建自测试设计。仿真结果表明,这些可测试性设计大大缩短了测试代码的长度。-modern microproces
planta_fagner
- is a test of a verilog implementation to do a oscilloscope with dual-port RAM
br_testRAM
- 文章给出了RAM测试的策略,并给出了流程图,可以方便的测试RAM的完好性。-In this paper, the strategy RAM test, and gives a flow chart can easily test the good of RAM.
test
- The design shows how to use Dual port RAM in FPGA design
RAM-inspecting-method
- 讲述RAM的数据线测试方法。分析地址线短路、断路的测试原理。分析存贮单元测试手段。-About RAM data line test method. The analysis of the address line short-circuit, open circuit test principle. Analysis of storage unit testing means.
3
- 有20个无符号数存放在内部RAM从41H开始的存储单元中,试对他们求和并将结果存放在40H单元中(设和小于等于255)-There are 20 unsigned number stored in the internal RAM storage unit from the beginning of the 41H, test for them and the results are stored in the 40H summing unit (set and less than or equ
Memory-read-and-write-test
- 对指定地址区间的RAM(2000H~23FFH)先进行写数据55AAH, 然后将其内容读出再写到3000H~33FFH中。-The specified address range RAM (2000H ~ 23FFH) first write data 55AAH, then re-read its contents written in 3000H ~ 33FFH.
U-Boot启动第二阶段代码分析
- U-Boot第一阶段的启动流程。(nandflash启动,把nand的4k代码考到sram中,因为nand没址线,不能映射到内存,所以通过sram进行过度,sram中4k代码把整个uboot拷贝到sdram上,初始化好堆栈,为c语言提供条件,进入uboot的第二阶段! )这个阶段主要是初始化硬件设备,为加载U-Boot的第二阶段代码准备RAM空间最后跳转到lib_arm/board.c中start_armboot函数,这是第二阶段的入口点。(U-Boot first phase of the s