文件名称:ARMJTAG
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JTAG+调试原理,中文版。这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍,在此基础上,结合ARM7TDMI详细介绍了的JTAG调试原理。-JTAG+ debug principle, the Chinese version. This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, on this basis, combined with ARM7TDMI described in detail the principles of JTAG debugging.
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ARMJTAG.pdf
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