SIFT是由UBC（university of British Column）的教授David Lowe 于1999年提出， 并在2004年得以完善的一种检测图像关键点（key points , 或者称为图像的interest points(兴趣点) )， 并对关键点提取其局部尺度不变特征的描绘子， 采用这个描绘子进行用于对两幅相关的图像进行匹配（matching）。 目前， SIFT可以说是所有图像局部特征描述特征子 中最火的一个了。-SIFT was developed by David Lowe, a professor at UBC (University of British Column) in 1999, and developed a key point (or interest points) of the image in 2004, and A sketch of the local scale invariant feature is extracted　the key point, and the descr iptor is used to perform matching on the two related images. At present, SIFT can be described as one of the hottest features of all local image features.