文件名称:Reliablity_ramp
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- 上传时间：2012-11-16
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文件大小：37.18kb
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实现了Jedec标准中对超薄膜氧化层的MOS电容的Time-zero可靠性测试方法。可直接用于半导体器件可靠性测试中-a realization of Time-zero dilectric breakdown according to Jedec standard,which can use to achieve reliability of wafer
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下载文件列表
Reliablity_ramp_thin_oxide/Reliabilitylib/help/header.h
Reliablity_ramp_thin_oxide/Reliabilitylib/help/header.hlp
Reliablity_ramp_thin_oxide/Reliabilitylib/help/Reliabilitylib_visibility
Reliablity_ramp_thin_oxide/Reliabilitylib/help/vramp_thinOxide.hlp
Reliablity_ramp_thin_oxide/Reliabilitylib/help/vramp_thinOxide_proto.h
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/dllmain.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/Reliabilitylib.lrf
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/Reliabilitylib_modules.mak
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/w_vramp_thinOxide.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src/dllmain.c
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src/w_vramp_thinOxide.c
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc60.idb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc60.pdb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc70.idb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc70.pdb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vramp_thinOxide.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/Reliabilitylib.def
Reliablity_ramp_thin_oxide/Reliabilitylib/src/vramp_thinOxide.c
Reliablity_ramp_thin_oxide/Reliabilitylib.dll
Reliablity_ramp_thin_oxide/Reliabilitylib.exp
Reliablity_ramp_thin_oxide/Reliabilitylib.lib
Reliablity_ramp_thin_oxide/Reliabilitylib_proto.h
Reliablity_ramp_thin_oxide/Reliabilitylib/bak
Reliablity_ramp_thin_oxide/Reliabilitylib/help
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src
Reliablity_ramp_thin_oxide/Reliabilitylib/lock
Reliablity_ramp_thin_oxide/Reliabilitylib/obj
Reliablity_ramp_thin_oxide/Reliabilitylib/src
Reliablity_ramp_thin_oxide/Reliabilitylib
Reliablity_ramp_thin_oxide
Reliablity_ramp_thin_oxide/Reliabilitylib/help/header.hlp
Reliablity_ramp_thin_oxide/Reliabilitylib/help/Reliabilitylib_visibility
Reliablity_ramp_thin_oxide/Reliabilitylib/help/vramp_thinOxide.hlp
Reliablity_ramp_thin_oxide/Reliabilitylib/help/vramp_thinOxide_proto.h
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/dllmain.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/Reliabilitylib.lrf
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/Reliabilitylib_modules.mak
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj/w_vramp_thinOxide.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src/dllmain.c
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src/w_vramp_thinOxide.c
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc60.idb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc60.pdb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc70.idb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vc70.pdb
Reliablity_ramp_thin_oxide/Reliabilitylib/obj/vramp_thinOxide.obj
Reliablity_ramp_thin_oxide/Reliabilitylib/Reliabilitylib.def
Reliablity_ramp_thin_oxide/Reliabilitylib/src/vramp_thinOxide.c
Reliablity_ramp_thin_oxide/Reliabilitylib.dll
Reliablity_ramp_thin_oxide/Reliabilitylib.exp
Reliablity_ramp_thin_oxide/Reliabilitylib.lib
Reliablity_ramp_thin_oxide/Reliabilitylib_proto.h
Reliablity_ramp_thin_oxide/Reliabilitylib/bak
Reliablity_ramp_thin_oxide/Reliabilitylib/help
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_obj
Reliablity_ramp_thin_oxide/Reliabilitylib/kitt_src
Reliablity_ramp_thin_oxide/Reliabilitylib/lock
Reliablity_ramp_thin_oxide/Reliabilitylib/obj
Reliablity_ramp_thin_oxide/Reliabilitylib/src
Reliablity_ramp_thin_oxide/Reliabilitylib
Reliablity_ramp_thin_oxide
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