搜索资源列表
PF8563
- PF8563测试程序，包含有各种子程序和调用接口-PF8563 test procedure includes various subroutine call interface and so on.
CH375_test
- CH375这个经典的芯片，相信很多人想了解他，这是一个 测试 程序-CH375 this classic chip, I believe many people would like to know him, this is a test procedure
2008121002
- VFD显示屏的驱动UPD16312的完整C测试程序,已正常使用.-VFD display of UPD16312 complete C drive test procedure has been normal use.
test
- 很好的串口测试程序 我试过 很实用 很好用-Serial test procedure very good I tried to use a good practical
NRF24L01_testrar
- NRF24L01无线射频模块开发测试程序，mcu为AT89S52，编程环境keil，调试通过。-The development of radio frequency modules NRF24L01 test procedure, mcu for AT89S52, programming environment keil, debugging through.
test
- 一个测试程序 一个测试程序 一个测试程序-A test procedure of a testing procedure based on a test procedure of a test procedure of a test procedure
IST3042-test
- 驱动IC为IST3042的液晶测试程序 接口为SPI3，非常实用，方便初学者/-LCD driver IC test procedure for the IST3042 interface SPI3, very practical, easy for beginners /
MCGS51PLC-TEST
- 51单片机与MCGS的连接，此为MCGS的测试程序-51 and MCGS connection, this is the test procedure MCGS
STC-timerauart--test
- STC单片机的timer和串口uart测试程序，简单明了，已经验证可用，适合初学者-STC microcontroller timer and serial uart test procedure is simple, have verified that the available, suitable for beginners
test
- aduc812的spi 单片机作为主模式的测试程序-aduc812 spi microcontroller as the main mode of the test procedure
barrier-test
- 小车自动壁障测试程序，使用STC12C5A60S2芯片。-The car automatic barrier test procedure, to use STC12C5A60S2 chip.
HT1621test-procedure
- 本测试程序能够测试HT1621的每一个字段，依次点亮 每一个字段-This test procedure to test the HT1621 every field, each field were lit
24C02-fleet-test-procedure-v1
- 24C02的51测试程序,可以用于保存密码什么的-24C02 51 test procedures can be used to save passwords
Test-procedure-calls
- 打电话测试程序,单片机发送数据时，我们的程序的延时时间有点长，所以大家在按下打电话或者挂电话按键时，需要等一段时间 -Test procedure calls
CAN-test-procedure
- CAN测试程序-CAN模块光盘资料-CAN test procedure-CAN test procedure
steering-gear-test
- 智能车舵机测试程序，舵机在0-180度范围内旋转-Intelligent vehicle steering gear test procedure in the range of servo rotation 0-180 degrees
DAC-test
- 基于STM32F103ZE的DAC测试程序-The DAC test procedure based STM32F103ZE
IIC-test
- 基于STM32F103ZE的IIC测试程序-The IIC test procedure based STM32F103ZE
ADC-Test
- nxp公司ARM单片机LPC1343，数模转换AD的完整测试程序。-nxp company ARM microcontroller LPC1343, digital to analog conversion AD complete test procedure.
collect test
- 一个案子的测试程序，集合CAN,正交编码，SPI，ADC,FLASH，等(A test procedure for a case, set CAN, orthogonal encoding, SPI, ADC, FLASH, etc)