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ceshi
- 仿真ic测试的程序,测试向量我们采用随机向量生成法,假定某人故障点存在s-a-0或s-a-1故障,由随机生成的向量对整个电路进行测试,若输出端的值与无故障电路的值不同,则测试成功,说明该向量可以检测出该故障。-Ic simulation test procedures, test vectors we use random vector generation, it is assumed that a person point of failure exist sa-0 or sa-1 faul
ICcarddelopmentboard
- 非接触IC卡开发板操作使用手册,详细介绍ic卡读写操作测试,以及参数的设置-Non-contact IC card development board operations manual, detailing the operation of the test ic card reader, and the parameters set
E001_CP_V2
- 半导体IC集成电路测试程序:该程序主要基于chroma 3360D平台上开发用于测试LED横流驱动类集成电路;-The semiconductor IC testing program: This program is mainly based on the the the chroma 3360D platform developed for the test LED crossflow drive class integrated circuit
