本文介绍一种基于NI LabVIEW和北京君合泰科技有限公司U18数据采集卡的晶体管特性测试仪的设计方法，内容包含循环扫描数据采集、回扫消隐、多曲线显示、传输系数计算、被测硬件电路设计等，并给出详细的前面板图和程序框图以及三极管、MOS管、光电耦合器等部分器件的特性曲线测试例子-This paper introduces a design method of transistor characteristic tester based on　NI LabVIEW and Beijing Junhetai Technology Co., Ltd. U18 data acquisition card, the content contains a circular scan data acquisition, blanking, multi curve display, transmission coefficient calculation, and gives details of the front panel and software block diagram and some test examples’ characteristic curves of　transistor, MOS device, photoelectric coupler device etc.