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文件名称:VlsiTesting

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  • 上传时间:
    2016-11-09
  • 文件大小:
    1.18mb
  • 已下载:
    0次
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  • 下载说明:
    别用迅雷下载,失败请重下,重下不扣分!

介绍说明--下载内容来自于网络,使用问题请自行百度

atpg, automatic test pattern generation
(系统自动生成,下载前可以参看下载内容)

下载文件列表

VlsiTesting-master/
VlsiTesting-master/PA1/
VlsiTesting-master/PA1/.gitignore
VlsiTesting-master/PA1/bin/
VlsiTesting-master/PA1/bin/golden_atpg
VlsiTesting-master/PA1/doc/
VlsiTesting-master/PA1/doc/PA1.doc
VlsiTesting-master/PA1/doc/~$PA1.doc
VlsiTesting-master/PA1/podem/
VlsiTesting-master/PA1/podem/atpg
VlsiTesting-master/PA1/podem/atpg.h
VlsiTesting-master/PA1/podem/display.c
VlsiTesting-master/PA1/podem/faultsim.c
VlsiTesting-master/PA1/podem/global.h
VlsiTesting-master/PA1/podem/init_flist.c
VlsiTesting-master/PA1/podem/input.c
VlsiTesting-master/PA1/podem/level.c
VlsiTesting-master/PA1/podem/logic_tbl.h
VlsiTesting-master/PA1/podem/makefile
VlsiTesting-master/PA1/podem/miscell.h
VlsiTesting-master/PA1/podem/pi_reach.c
VlsiTesting-master/PA1/podem/podem.c
VlsiTesting-master/PA1/podem/sim.c
VlsiTesting-master/PA1/podem/test.c
VlsiTesting-master/PA1/podem/tpgmain.c
VlsiTesting-master/PA1/readme
VlsiTesting-master/PA1/report.docx
VlsiTesting-master/PA1/report.pdf
VlsiTesting-master/PA1/sample_circuits/
VlsiTesting-master/PA1/sample_circuits/c1355.ckt
VlsiTesting-master/PA1/sample_circuits/c1355.ckt.uf
VlsiTesting-master/PA1/sample_circuits/c1355.input
VlsiTesting-master/PA1/sample_circuits/c17.ckt
VlsiTesting-master/PA1/sample_circuits/c17.ckt.uf
VlsiTesting-master/PA1/sample_circuits/c17.input
VlsiTesting-master/PA1/sample_circuits/c17.input.uf
VlsiTesting-master/PA1/sample_circuits/c1908.ckt
VlsiTesting-master/PA1/sample_circuits/c2670.ckt
VlsiTesting-master/PA1/sample_circuits/c3540.ckt
VlsiTesting-master/PA1/sample_circuits/c432.ckt
VlsiTesting-master/PA1/sample_circuits/c499.ckt
VlsiTesting-master/PA1/sample_circuits/c499.ckt.uf
VlsiTesting-master/PA1/sample_circuits/c499.input
VlsiTesting-master/PA1/sample_circuits/c5315.ckt
VlsiTesting-master/PA1/sample_circuits/c6288.ckt
VlsiTesting-master/PA1/sample_circuits/c6288.ckt.uf
VlsiTesting-master/PA1/sample_circuits/c6288.input
VlsiTesting-master/PA1/sample_circuits/c7552.ckt
VlsiTesting-master/PA1/sample_circuits/c7552.ckt.uf
VlsiTesting-master/PA1/sample_circuits/c7552.input
VlsiTesting-master/PA1/sample_circuits/c880.ckt
VlsiTesting-master/PA2/
VlsiTesting-master/PA2/bin/
VlsiTesting-master/PA2/bin/golden_atpg
VlsiTesting-master/PA2/doc/
VlsiTesting-master/PA2/doc/PA2.doc
VlsiTesting-master/PA2/podem/
VlsiTesting-master/PA2/podem/atpg
VlsiTesting-master/PA2/podem/atpg.h
VlsiTesting-master/PA2/podem/display.c
VlsiTesting-master/PA2/podem/display.o
VlsiTesting-master/PA2/podem/faultsim.c
VlsiTesting-master/PA2/podem/faultsim.o
VlsiTesting-master/PA2/podem/global.h
VlsiTesting-master/PA2/podem/init_flist.c
VlsiTesting-master/PA2/podem/init_flist.o
VlsiTesting-master/PA2/podem/input.c
VlsiTesting-master/PA2/podem/input.o
VlsiTesting-master/PA2/podem/level.c
VlsiTesting-master/PA2/podem/level.o
VlsiTesting-master/PA2/podem/logic_tbl.h
VlsiTesting-master/PA2/podem/makefile
VlsiTesting-master/PA2/podem/miscell.h
VlsiTesting-master/PA2/podem/pi_reach.c
VlsiTesting-master/PA2/podem/podem.c
VlsiTesting-master/PA2/podem/podem.o
VlsiTesting-master/PA2/podem/sim.c
VlsiTesting-master/PA2/podem/sim.o
VlsiTesting-master/PA2/podem/tags
VlsiTesting-master/PA2/podem/test.c
VlsiTesting-master/PA2/podem/test.o
VlsiTesting-master/PA2/podem/tpgmain.c
VlsiTesting-master/PA2/podem/tpgmain.o
VlsiTesting-master/PA2/readme
VlsiTesting-master/PA2/reports/
VlsiTesting-master/PA2/reports/c1355.input
VlsiTesting-master/PA2/reports/c1355.input.golden
VlsiTesting-master/PA2/reports/c17.input
VlsiTesting-master/PA2/reports/c17.input.golden
VlsiTesting-master/PA2/reports/c2670.input
VlsiTesting-master/PA2/reports/c2670.input.golden
VlsiTesting-master/PA2/reports/c3540.input
VlsiTesting-master/PA2/reports/c3540.input.golden
VlsiTesting-master/PA2/reports/c432.input
VlsiTesting-master/PA2/reports/c432.input.golden
VlsiTesting-master/PA2/reports/c499.input
VlsiTesting-master/PA2/reports/c499.input.golden
VlsiTesting-master/PA2/reports/c6288.input
VlsiTesting-master/PA2/reports/c6288.input.golden
VlsiTesting-master/PA2/reports/c7552.input
VlsiTesting-master/PA2/reports/c7552.input.golden
VlsiTesting-master/PA2/reports/c880.input
VlsiTesting-master/PA2/reports/c880.input.golden
VlsiTesting-master/PA2/sample_circuits/
VlsiTesting-master/PA2/sample_circuits/c1355.ckt
VlsiTesting-master/PA2/sample_circuits/c1355.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c17.ckt
VlsiTesting-master/PA2/sample_circuits/c17.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c1908.ckt
VlsiTesting-master/PA2/sample_circuits/c2670.ckt
VlsiTesting-master/PA2/sample_circuits/c2670.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c3540.ckt
VlsiTesting-master/PA2/sample_circuits/c3540.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c432.ckt
VlsiTesting-master/PA2/sample_circuits/c432.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c499.ckt
VlsiTesting-master/PA2/sample_circuits/c499.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c5315.ckt
VlsiTesting-master/PA2/sample_circuits/c6288.ckt
VlsiTesting-master/PA2/sample_circuits/c6288.ckt.uf
VlsiTesting-master/PA2/sample_circuits/c7552.ckt
VlsiTesting-master/PA2/sample_circuits/c7552.ckt.uf
VlsiTest

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