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fft1
- 快速傅立叶变换（来源《C常用算法集》） 本函数测试OK,可以在TC2.0,VC++6.0,Keil C51测试通过 如果你的MCS51系统有足够的RAM时,可以验证一下用单片机处理FFT有多么的慢。-Fast Fourier Transform (Source C commonly used algorithm sets) the function test OK, TC2.0 VC++6.0 the Keil C51 test by If the the MCS51 system yo
2440test_keil
- mini2440 从ADS移植到keil4 测试代码，用j_link直接调试通过，有RAM和FLash两种环境-mini2440 transplant from ADS to keil4 test code, debugging through with j_link directly RAM and FLash environment
DEC6713_krsys
- CPLD写数进RAM，从DSP读数，测试通讯-CPLD write a number into the RAM, the readings from the DSP test communications
suspend_test
- Suspend to RAM and standby test facility for linux.
mmu.tar
- 嵌入式ARM的mmu操作示例。设置MMU使得外部SDRAM可用，然后对比led测试程序在内部RAM和外部RAM上的运行速度。-A mmu operation demo for embedded arm. This program set the mmu of arm and make external SDRAM usable, then we compare the excutting speed of a led test program between internal SRAM and
LED_Test
- LED_Test实验 === === === === === === === === === === === === === === === = 本实验实现对四型箱主板上的四个LED灯进行控制。本例程有两种运行方式。 LED_Test IN RAM 将程序下载到SDRAM中调试。 LED_Test IN Flash 将程序烧写到Nor Flash中。上电自动运行。 ========================================================
5.4_UART_Test
- UART_Test实验 === === === === === === === === === === === === === === === = 本实验实现监视串行口UART0动作，并从UART0接收到的字符串回送显示。本例程有两种运行方式。 UART_Test IN RAM 将程序下载到SDRAM中调试。 UART_Test IN Flash 将程序烧写到Nor Flash中。上电自动运行。 ========================================
ram_ip
- 本程序是利用ise平台提供的IP核设计出的ram，已通过上机运行检测。-This procedure is to use ise platform provides IP core design of the ram, has passed the test on the machine running.
fpgaaverilogamaxamin
- verilog 编写的比较最大值最小值得的程序，而且能够求出最大最小值在ram中存储的位置，测试通过下载即用-Comparison of the maximum write verilog smallest worthwhile program, and minimum and maximum values can be obtained is stored in ram position, the test that is used by downloading
430-SHILICX
- 目录：1. 堆栈时钟初始化 2. RAM自测子程序 3. 二进制转化为BCD码（二进制16位（65536）放R15，结果放R4，R5） 4. BCD码转化为二进制（BCD码放R4，二进制放R5） R5=XO+10*(X1+10*(X2+10*X3)) 5. BCD码转化为二进制（BCD码放R4，二进制放R5）R5=XO+10*X1+100*X2+1000*X3 6. 冒泡排序法（适合20个数字以下） 7. X=a^+b^（a为2个字节，b为2个字节，X为3个字
MSP430--16X16
- 目录：1. 堆栈时钟初始化 2. RAM自测子程序 3. 二进制转化为BCD码（二进制16位（65536）放R15，结果放R4，R5） 4. BCD码转化为二进制（BCD码放R4，二进制放R5） R5=XO+10*(X1+10*(X2+10*X3)) 5. BCD码转化为二进制（BCD码放R4，二进制放R5）R5=XO+10*X1+100*X2+1000*X3 6. 冒泡排序法（适合20个数字以下） 7. X=a^+b^（a为2个字节，b为2个字节，X为3个字
5.3_Button_Test
- === === === === === === === === === === === === === === === = Button_Test实验 === === === === === === === === === === === === === === === = 本实验实现通过扩展IO来接收KEY1和KEY2的中断，并显示在超级终端上。本例程有两种运行方式。 Button_Test IN RAM 将程序下载到SDRAM中调试。 Button_Test IN
ram_data
- 一个RAM与USB相连，测试数据传输，使用USB3.0开发板已经测试成功。-A RAM are connected to the USB, the test data transmission, use the start development board has been tested successfully.
STM32SelfTest
- STM32的开机自检程序，主要包括CPU自检，RAM自检，系统时钟的设定以及看门狗的开启和关闭。-The POST STM32 procedures, including the self-test CPU, RAM self-test, the system clock settings and watchdog on and off.
dect
- 对MSP430单片机的RAM，SPI接口，串口，引脚等模块进行测试-On the MSP430 MCU' s RAM, SPI interface, serial port, pin test modules
Test_2_Port_RAM
- Quartus ii双口RAM模块的使用，包括源码、ram时序图以及测试报告-Use Quartus ii dual-port RAM modules, including source code, ram timing diagram and test reports
tstSRAM
- 测试STC系列片外ram大小，如果ram溢出，即地址访问出错，串口输出数据是未定义的。-STC Test series outside the ram size, if the ram overflow error that address access, serial output data is undefined.
3
- 有20个无符号数存放在内部RAM从41H开始的存储单元中，试对他们求和并将结果存放在40H单元中（设和小于等于255）-There are 20 unsigned number stored in the internal RAM storage unit from the beginning of the 41H, test for them and the results are stored in the 40H summing unit (set and less than or equ
dect
- 对MSP430单片机的RAM，SPI接口，串口，引脚等模块进行测试-On the MSP430 MCU' s RAM, SPI interface, serial port, pin test modules
Exp5-LCD
- 基于ram9linu x开发板实验程序 基于ram 9linux开发板实验程序 -Ram9linux development board based on ram9linu experimental procedure x ram-based development board based on the experimental procedure experimental procedure 9linux ram9linux development board development boar