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BSQ
- C语言实现对51单片机的数码管，双光柱，按键功能的实现，以及双积分AD转换器的ICL7135的转换并显示。-C language to 51 SCM realizing the digital tube, double beam, buttons, and the realization of the function of the double integral AD converter ICL7135 conversion and displayed.
liyongduishecesu
- 基于单片机利用红外对射管进行的小车测速装置，欢迎共享-Microcontroller-based infrared beam tube of the car speed device, please share
zxd
- 智能数字双光柱数显表源程序，c51语言开发设计。MSc51系列-Intelligent dual-beam digital display digital source, c51 language development and design. MSc51 Series
hongwairenyuanjishu
- 红外门卫，实现基于51单片机和双红外对射的人员出入计数系统，具有误判率低、报警语音提示、人数限制、远程控制、参数断电记忆、等功能，属原创，已实际测试，效果很好。-Infrared guard, 51-based single-chip and dual-beam infrared counting system of personnel access, with false positive rate is low, the alarm voice prompts, limit the numb
aping
- 高斯光束整形系统的光学设计 Gaussian beam shaping optical system design-Gaussian beam shaping optical system design
danpianjimimasuo.
- 用单片机控制实现电子密码锁，基于24C02和LCD液晶显示的电子密码锁(原创)。-A sequence of numbers or letters used to open a combination lock.electron beam tube display equipment。
bujdj
- 本设计以AT89C52单片机为核心，以4*4矩阵键盘为输入，光电对射式传感器为测速原件达到了对步进电机的测速与调速目的，完成了本设计的基本要求。-The design for the AT89C52 microcontroller as the core, 4* 4 matrix keyboard input, photoelectric beam sensor for velocimetry original reach of the stepper motor speed measurem
zhinengdiandi(PID)
- 使用AT89c51设计的一款智能点滴，使用增量式PID算法进行闭环控制，通过对射式红外传感器检测液滴的滴速，使用1602显示液滴滴速以及病人需求的液滴-Using AT89c51 design a smart bit by bit, using the incremental PID algorithm for closed-loop control, through-beam infrared sensor detects droplets drip rate, using the 1602
beamresort
- 梁编号软件，用于CAD对建筑结构梁的重新编号-Beam ID software for CAD building structural beams renumbered
dual_display-
- 数字与光柱双显仪表，其中的光柱部分驱动程序，有详细的文字说明，里面介绍两个方法，一个采用大循环移位，速度慢。一个主要移位动态字节，速度快-Figures with light beam dual display instrument, in which the light beam part of the driver, there is a detailed text descr iption, which describes two methods, a large circular shi
counter
- 通过红外对射传感器计数，然后LCD显示滴速，课用于自动计数，该程序用于医院点滴滴速测量-Infrared beam sensor count, then the LCD display the drip rate class for automatic counting, the program for hospital drip drip rate measurement
QuadraticQuadAssemble
- 梁单元的集合代码，属于matlab在有限单元法中的初级应用。-Collection of beam elements in matlab
DACsawtooth
- DAC锯齿波 锯齿波电压发生器在一些控制应用中,需要有一个线性增长的电压(锯齿波)来控制检测过程、移动记录笔或移动电子束等-DAC sawtooth sawtooth voltage generator control in some applications, the need for a linear growth voltage (sawtooth) to control the testing process, moving the stylus to move the electr
main
- 一个基于c语言的51单片机程序，可实现对旋转物体转速的测量，采用对射式光电开关，产生与旋转物体相对应的脉冲信号，以单片机采样脉冲信号，计算每分钟脉冲信号的数目，即电机对应的转速值，通过数码管实时显示电机的转速值；转速测量峰值大于100r/s，实时显示转速。 -Based on 51 MCU c language program, enabling measurement of the speed of rotation of the object, using the beam photoe
VBmscomm_bbq
- 用串口控制富士变频器，束下线实现正反转。以及根据需要精确控制，调整高度。-Fuji Inverter with serial control, beam off the assembly line to achieve positive inversion. And need to be adjusted according to height, precise control.
CP2102
- （1） 用激光笔改装激光枪，激光枪可受电路控制发射激光束，激光束照射于胸环靶上弹着点的光斑直径＜5mm；激光枪与胸环靶间距离为3m。-(1) modified by a laser gun laser pointer, the laser gun can be controlled by the circuit emits a laser beam, a laser beam is irradiated on the point of impact on the chest of the tar
PL2303
- （2） 激光枪固定在一机构上，可通过键盘控制激光枪的弹着点（用键盘设置激光束在靶纸上上下、左右移动一定距离-(2) fixed to a laser gun mechanism, a laser gun can be controlled by the keyboard of the point of impact (using the keyboard provided in the target of the laser beam up and down the paper, move ar
1234567
- 如图1所示门形支架的一个立柱上用转轴固定一根U型导轨，导轨的另一端可由固定在顶梁上的电机控制其上下运动，使小球在导轨上按要求灵活滚动或移位。导轨以转轴处为原点，以厘米（cm）为单位标注位置（见图中放大部分）-As shown in Figure 1 a column of the portal type bracket with a fixed rotating shaft U-type guide rail and the other end of the guide rail can be
1
- than dc parameter (saturation current, threshold voltage, etc.) degradation. An electron beam probing was performed on a 64-Mb DRAM chip to detect the influence of gate capacitance variation in dynamic circuit blocks before and after hot-carr
2
- for the first time, the impact of hotcarrier-induced gate capacitance variation on dynamic circuits in a VLSI chip. To investigate the mismatch drift due to the hot-carrier-induced gate capacitance variation, internal probing was performed at