文件名称:ARM_JTAG_debug_Principle
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- 上传时间:2012-11-16
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这篇文章主要介绍 ARM JTAG调试的基本原理。基本的内容包括了 TAP (TEST ACCESS
PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍,在此基础上,结合 ARM7TDMI 详细
介绍了的 JTAG 调试原理。-This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, on this basis, combined with ARM7TDMI described in detail the principles of JTAG debugging.
PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍,在此基础上,结合 ARM7TDMI 详细
介绍了的 JTAG 调试原理。-This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, on this basis, combined with ARM7TDMI described in detail the principles of JTAG debugging.
相关搜索: BOUNDARY SCAN
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ARM JTAG 调试原理.pdf
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