主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-Introduces the basic principles of ARM JTAG debug. The basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, in this based on the combination described in detail in the ARM7TDMI JTAG debugging principles.