测试外部中断0和外部中断1低电平触发,因为实验板上的K3键与外部 中断0的引脚相连,K4与单片机的外部中断1相连,本实验要完成的测 试结果是,按下K3键时,即外部中-Test external interrupt 0 s and 1 low level trigger external interrupt, because K3 key on the experimental plate connected with the external interrupt 0 pins, K4 and MCU external interrupt 1 are linked together, the experimental test results are to be completed, press the K3 key, namely the external...