从 Mentor Graphics 的自动测试图形生成（ATPG）工具 FastScan的

测试文档中提取出测试电路（CUT）的测试模式，生成便于对应压缩算法的文件

格式。 本文中， 给出了 2 种压缩测试模式的方法， 一种是基于统计的哈夫曼编码，

一种是基于差分运算的Golomb 编码。本次毕业设计中，在熟悉Mentor Graphics

ATPG工具 FastScan的基本功能和其主要的测试模式输出文件的格式的基础上，

实现其中测试结构和测试模式数据的分析提取， 并且在掌握典型的测试模式压缩

算法的思想以及 C/C++开发环境的前提下，选择或综合相关的优化压缩算法，针

对测试结构信息，实现测试模式数据的压缩，及软件的基本图形化操作和结果报

告界面。 -the scheme of the tested circuits is extracted from the test

documents of FastScan, a tool of Automatic Test Pattern Generator of Mentor

Graphcis, and translated into a form processed by the compressing algorithm. The

paper proposes two methods for compressing　tested pattern, one based on statistical

Huffman Code, the other based on differential Golomb code. Based on the function of

Mentor Graphics ATPG and the format of output file of the test pattern, the program

extracts and analyzes of the tested structure and data pattern　familiar with typical

compressing algorithm and C/C++ developing environments, the program selects and

synthesizes the relevant optimal compressing algorithm, successfully compresses the

test pattern data related with the structural information, and implements the graphical

interactive interface and a report form of the result.