搜索资源列表
30D-TEST
- 30天自动放电程序,有测试功能.单片机用ATNILY13V,低成本的单片机.-30 days of the automatic discharge process, a test function.
test
- 本程序是应用于DSP TMS320VC5416芯片的FLASH读写程序，使用本程序可以对NOR型FLASH进行编程、擦除操作-This procedure is applied to the FLASH chip DSP TMS320VC5416 to read and write, the use of this procedure can be carried out on the NOR-based FLASH program, erase operation
temp-test
- 1线制 温度芯片18B20文档芯片测试源码-1-wire temperature chips documentation 18B20-chip test source
NEC78K0513D-test
- 78F0513C语言实验例程，包含led流水灯、ad、16位定时器实验文件，希望对大家能有所用处。-Experimental 78F0513C language routines, including water led lights, ad, 16-bit timer test document, in the hope that we can be useful.
a1200-neopop-test-rev03
- Test to port the emulator neopop of motorola e680i to motorola a1200. Imcomplete.
8051_test2
- 简单的8051的内核测试，已经验证通过，VLOGER编写-8051 simple test of the core, has been adopted to verify, VLOGER prepared
NRF24L01_testrar
- NRF24L01无线射频模块开发测试程序，mcu为AT89S52，编程环境keil，调试通过。-The development of radio frequency modules NRF24L01 test procedure, mcu for AT89S52, programming environment keil, debugging through.
tone
- 6713dsk上的音频口测试程序 发出特定频率的正弦波形 可测试音频口是否损坏等~-I 6713dsk audio on the issue of test procedures specific frequency sinusoidal waveform audio I can test whether the damage ~
test
- 一个测试程序 一个测试程序 一个测试程序-A test procedure of a testing procedure based on a test procedure of a test procedure of a test procedure
test
- arm实现的数字芯片测量，能测试各种74系列的芯片-arm to achieve measurement of the number of chips that can test the 74 series of chips
test
- 比较两个数大小的源程序，使用Verilog编写，而且包含了测试代码部分，可用modelsim仿真得到波形-Comparison of two numbers the size of source, using Verilog write, but also contains some test code that can be used to be waveform simulation modelsim
16-test
- M16开发板测试程序~ DS1602 数码管 流水灯 AD 按键测试 DS1302 等测试~-M16 Development Board test procedures
HIDTestSource
- This program exercises the HID API of Windows for a specific device. It calls the relevant HID functions and shows the results. The extended test calls the HID functions with unusual but valid parameters.
Keytest
- 友善之臂MINI2440winceIO口测试程序，控制LED亮灭的-IO test, friendly arm MINI2440
fft_gen
- FFT vhdl generic: I m new to vhdl, and I tried to use xilinx fft core, but when I try to simulate it in test bench using ise simulator, I get zero results. here is what I do: 1- from core generator I choose fft core and create .vhd & .vho &
DCTest
- 电池测试工装，采用PIC16F873设计的。通过PWM进行充放电电流测试-Battery test tooling, using PIC16F873 design. Through the PWM to charge and discharge current test
Wince-ARM9-serialport-test
- WINCE6.0下的ARM9的C sharp 串口测试-serial port C sharp test program of ARM9 with WINCE 6.0
kb-test
- this a test keyboard code -this is a test keyboard code
test
- 基于can总线的通信，采用AT89S52单片机，测试单片机是否可以正常运行-Based on can bus communication, using AT89S52 microcontroller to test whether normal operation of microcontroller
FIR
- FIR滤波器的VHDL源代码及测试文件，已通过编译仿真，绝对正确。-FIR filter VHDL source code and test files, has passed the compiled simulation, absolutely correct.