搜索资源列表
videodigitalsignalscontroller
- 用fpga技术实现基本的视频信号处理：主题程序；视频图象数据采集程序；sram的读写控制；测试程序-they simply use the basic technology of video signal processing : theme; Video data acquisition procedures; SRAM literacy control; test procedures
5555
- 微波炉定时器集成电路的设计 1、 控制状态机：工作状态状态转换。 2、 数据装入电路：根据控制信号选择定时时间、测试数据或完成信号的装入。 3、 定时器电路：负责完成烹调过程中的时间递减计数和数据译码供给七段数码显示，同时还可以提供烹调完成时间的状态信号供控制状态机产生完成信号。 -microwave timer IC design a control state machine : state of the state conversion work. 2, data l
blocking
- 基于verilog语言的数据选择器，包括数据选择器的测试模块 -verilog language based on the data selector, including data selection for the test module
leon3-altera-ep2s60-ddr
- This leon3 design is tailored to the Altera NiosII Startix2 Development board, with 16-bit DDR SDRAM and 2 Mbyte of SSRAM. As of this time, the DDR interface only works up to 120 MHz. At 130, DDR data can be read but not written. NOT
dual_RAM.rar
- actel fusion startkit FPGA开发板试验例程，可实现2k8的双口ram，实现数据存储，缓冲。包含verilog HDL 语言源码,actel fusion startkit FPGA development board test routines, can be realized 2k8' s dual-port ram, achieving data storage, buffer. Language source code contains the verilog
latch
- 关于闩锁效应的产生机理、触发条件、防止措施以及器件的闩锁测试的一个资料文件-This is a generation of latch-up mechanism , trigger conditions , measures and devices to prevent latch- test data file.
EPM240_Uart
- 基于Quartus II的Verilog编写的Uart串口测试程序。数据收发机LED灯测试。-Based on the Verilog Quartus II prepared Uart serial port test program. LED lamp test data transceiver.
TLC5510_IIPRAM1
- FPGA控制双口RAM、实现TLC5510采样控制双口RAM读写！QUARTUS II8.0平台仿真验证通过，并在硬件上运行通过测试！-FPGA control of dual-port RAM, the realization of sampled-data control TLC5510 dual-port RAM read and write! QUARTUS II8.0 platform through simulation and hardware to run through the
DDR_SDRAM_controller
- DDR SDRAM控制器的VHDL源代码，含详细设计文档。 The DDR, DCM, and SelectI/O™ features in the Virtex™ -II architecture make it the perfect choice for implementing a controller of a Double Data Rate (DDR) SDRAM. The Digital Clock Manager (DCM) provides t
A_bit_serial_data_transmitter
- 比特序列传送模块 把输入的八位比特数据 做循环后每个比特输出 详细请看英文描述-• To create Verilog-HDL modules written in the RTL style appropriate for both simulation and synthesis, for the various component parts of an Asynchronous Serial Data Transmitter. • To verify th
test
- PPM编码的VHDL实现，可实现8位并行输入数据转换为串行的PPM编码-PPM coded VHDL implementation can be realized 8-bit parallel input data into a serial coded PPM
test
- xilinx ise6.3编译环境，verilog控制程序。实现对外部ad转换数据自动采集计算，并发送到DSP最后处理-xilinx ise6.3 build environment, verilog control procedures. To achieve automatic data acquisition external ad converter calculated and sent to final processing DSP
CIEDE2000
- CIEDE2000计算实例，每个步骤都有，计算最新的色差公式-Ref: G. Sharma, W. Wu, E.N. Dalal,"THE CIEDE2000 COLOUR-DIFFERENCE FORMULA: Implementation Notes, Supplementary Test Data, and Mathematical Observations," submitted to COLOR RESEARCH AND APPLICATION, Jan 2004.
FPGA
- FPGA的新型测试数据采录仪的电子设计Collect and record the new FPGA device test data in electronic design-Collect and record the new FPGA device test data in electronic design
test
- I2C读数据，并显示在LED上。现在编译能通过但是仿真不行。求高手指正！-read iic data and displays with LED
SDRAM
- 芯片测试资料，主要包括lcd，时钟，计数器分频器的设计-Chip test data, including lcd, clock, counter divider design
ram_data
- 一个RAM与USB相连，测试数据传输，使用USB3.0开发板已经测试成功。-A RAM are connected to the USB, the test data transmission, use the start development board has been tested successfully.
test-des
- Encryption has become a part and parcel of our lives and we have accepted the fact that data is going to encrypted and decrypted at various stages. However, there is not a single encryption algorithm followed everywhere. There are a number of algorit
8-bit-RISC_CPU
- 8位RISC_CPU设计的verilog源码以及工程文件、测试数据文件。在modelsim 10.1d下验证成功，打开工程文件即可使用。-8 RISC_CPU design verilog source code and project files, test data files. In modelsim 10.1d validation is successful, open the project file can be used.
mj10
- 实现门禁系统，可以做网店实战的项目，对接数据库，不过里面没有数据库想对应的测试数据(The implementation of the entrance guard system, can do online shop actual projects, docking database, but there is no database to corresponding test data in it.)