现代先进微处理器有非常高的集成度和复杂度，又有寄存器堆、Cache等嵌入式部件，而且芯片管脚数相对较少，必须要有一定的自测试设计和其它的可测试性设计来简化测试代码，提高故障覆盖率。本文简要讨论NRS4000微处理器芯片的以边界扫描测试为主体，以自测试为补充的可测试性设计框架。着重介绍芯片的边界扫描设计和芯片中译码控制器PLA和微程序ＲＯＭ以及采用内嵌RAM结构的指令Cache和寄存器堆的内建自测试设计。仿真结果表明，这些可测试性设计大大缩短了测试代码的长度。-modern microproces

Wireless sensor networks, networks of tiny devices, are being widely used in different aspects of everyday life. There is a need to simplify designing and implementing protocols and applications for these devices that is very complex and time c

The Virtex™ series provides dedicated blocks of on-chip, true dual-read/write port synchronous RAM, with 4096 memory cells. Each port of the block SelectRAM+™ memory can be independently configured as a read/write port, a read port, o

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